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07.01.2025

Best Poster Award at VLSID 2025

For the paper titled "AI-Driven Anomaly Detection in Oscilloscope Images for Post-Silicon Validation" by K. A. Akash, T. Wulf, T. Valentin, A. Geist, Prof. U. Kulau (E-EXK3) and Prof. S. Lal (E-EXK5) in collaboration with NXP semiconductors.