Publikationen aus 1997:

Mean Stresses in Microstructures due to Interface Stresses: A Generalization of a Capillary Equation for Solids

J. Weissmüller and J.W. Cahn
Acta materialia 45 (1997), 1899-1906.

Mobility of Gallium Confined in Nanostructured Alumina

H. Konrad, C. Karmonik, J. Weissmüller, H. Gleiter, R. Birringer and R. Hempelmann
Physica B 234-236 (1997), 173-174.

3 Small-Angle Scattering by Grain Boundaries in Nanocrystalline Solids: A Computer Simula­tion Study

I. Detemple, J. Weissmüller, R. Birringer, H. Gleiter
Scripta Materialia 37 (1997), 1685-1691.

Depth profiling using total reflection X-ray fluorescence spectrometry alone and in combination with ion beam sputtering.

H. Schwenke, J. Knoth, R. Günther, G. Wiener, and R. Bormann
Spectrochimica Acta Part B-Atomic Spectroscopy, 1997. 52(7): p. 795-803.

Ion beam sputtering techniques for high-resolution concentration depth profiling with glancing-incidence X-ray fluorescence spectrometry.

G. Wiener, R. Günther, C. Michaelsen, J. Knoth, H. Schwenke,and R. Bormann
Spectrochimica Acta Part B-Atomic Spectroscopy, 1997. 52(7): p. 813-821

Influence of the deformation conditions on the texture evolution in gamma-TiAl

A. Bartels, C. Hartig, S. Willems and H. Uhlenhut
Materials Science and Engineering a-Structural Materials Properties Microstructure and Processing (1997) 240 p.14-22.

Effect of temperature on elastic constants and dislocation properties of Fe-30% Al single crystals

M.H. Yoo, M. Koeppe, C. Hartig, H. Mecking, W. Hermann and H.G. Sockel
Acta Materialia (1997) 45 p.4323-4332.

Phases and phase transitions of KPF6

Huber, P., Krummeck, H., Baller, J., Kruger, J. K., Knorr, K. and Haussuhl, S.
Ferroelectrics(1997), 203, 1-4: 211-219.