Devices and Methods (Person in Charge)

This page gives an overview of the devices and methods of the BeEM with the names of the persons in charge for the particular device.

1. Scanning Electron Microscopes (SEM)

  • Zeiss Supra 55 VP FEG-SEM with Variable Pressure Mode (VP-Mode), EDS, WDS und EBSD (Building H, Room -1.24D , Person in Charge: Jens Timmermann, Tel.: -4575, Substitute: Tobias Krekeler, Tel.:-4667 and Martin Ritter, Tel.: -3544)
  • Leo Gemini 1530 FEG-SEM with EDS
    (Building M, Room 3526, Phone: 2320, Person in Charge: Tobias Krekeler, Phone: -4573, Substitute: Martin Ritter Phone: 4575,)

2. Transmission electron microscopes (TEM)

In the Transmission Mlectron microscopy (TEM, also Transmission Electron Microscope), the samples are irradiated by the electron beam (transmission). This enables direct imaging of the sample structure. The samples must be sufficiently thin, which requires special sample preparation.

Very high resolutions can be achieved with the TEM. The crystal structure can also be determined by elastic diffraction of the electrons at crystalline sample areas.

Our Talos F200X also offers a variety of other examination options. Please, see the menu on the left for more information.

  • FEI Talos F200X
    (Building H, Raum -1.23B, Person in Charge: Dr. Tobias Krekeler, Phone: -4667, Substitute: Dr. Gunnar Schaan, Phone: -4876)

3. Focussed Ion Beam (FIB)

  • FEI Helios NanoLab G3 (DualBeam)
    (Building H, Raum -1.23B, Phone: -4853, Person in Charge: Dr. Martin Ritter, Phone: -3543, Substitute: Dr. Gunnar Schaan, Phone: -4876)

4. Analytical Methods

In addition to the pure image generation (imaging process), electron microscopes can also be used for answering various analytical questions due to the different interaction processes of the electron beam with the sample material. Due to the formation of characteristic X-rays in the sample, for example, it is possible to determine the elemental composition of a sample (EDX and WDX). Whereas due to the diffraction of the electron beam on crystalline structures, the crystal structure and orientation can be determined (diffraction in TEM and EBSD at the SEM). The combination of different methods can also be used in connection with modern computer programs to generate 3D models of the sample structure or even individual sample phases.

4.1  EDS (Energy Dispersive X-ray Spectroscopy)

Available on all our electron microscopes. If you have any questions, please contact the person responsible for the particular device:

  • Zeiss Supra 55 VP FEG-SEM with Variable Pressure Mode (VP-Mode), EDS, WDS und EBSD (Building H, Room -1.24D , Person in Charge: Jens Timmermann, Tel.: -4575, Substitute: Tobias Krekeler, Tel.:-4667 and Martin Ritter, Tel.: -3544)
  • Leo Gemini 1530 FEG-SEM with EDS
    (Building M, Room 3526, Phone: 2320, Person in Charge: Tobias Krekeler, Phone: -4573, Substitute: Martin Ritter Phone: 4575,)
  • FIB FEI Strata 205
    (Building M, room 3526, phone: -2319, Person in Charge: Dr. Martin Ritter, phone: -3543, Substitute: Dr. Tobias Krekeler, phone: 4667)
  • FEI Talos F200X
    (Building H, Raum -1.23B, Person in Charge: Dr. Tobias Krekeler, Phone: -4667, Substitute: Dr. Gunnar Schaan, Phone: -4876)

4.2  WDS (Wave Dispersive X-ray Spectroscopy)

WDS is only available on the Zeiss Supra 55 VP. If you have any questions, please contact the person responsible for the device:

  • Zeiss Supra 55 VP FEG-SEM with Variable Pressure Mode (VP-Mode), EDS, WDS und EBSD (Building H, Room -1.24D , Person in Charge: Jens Timmermann, Tel.: -4575, Substitute: Tobias Krekeler, Tel.:-4667 and Martin Ritter, Tel.: -3544)

4.3  TEM Diffraction and TEM 3D Tomography

  • FEI Talos F200X
    (Building H, Raum -1.23B, Person in Charge: Dr. Tobias Krekeler, Phone: -4667, Substitute: Dr. Gunnar Schaan, Phone: -4876)

4.4  3D examinations and 3D reconstruction at the FIB

  • FEI Helios NanoLab G3 (DualBeam)
    (Building H, Raum -1.23B, Phone: -4853, Person in Charge: Dr. Martin Ritter, Phone: -3543, Substitute: Dr. Gunnar Schaan, Phone: -4876)

5. Optical Microscopes

  • Leica EZ4 HD stereo microscope
    (Building M, Room 2556, Contact: Lida Wang, Tel.: -4574)
  • Olympus SZ 30
    (Building M, Room 2556, Contact: Lida Wang, Tel.: -4574)

6. Sample Preparation

  • Leica EM RES102 The unique ion beam milling system combines the preparation of TEM, SEM and LM samples in one single benchtop unit, Contact:Tobias Krekeler, Tel.: -4667.
  • Leica EM TXP
    (Building M, Room 2556, Contact: Lida Wang, Tel.: -4574)
  • Sputter Coater SCD 050 by Baltec
    (Building M, Room 3526, Contact: Tobias Krekeler, Tel.: -4667)
  • Struers TenuPol-3
    (Building M, Room 2549, Contact: Lida Wang, Tel.: -4574)