Leica EM RES102 The unique ion beam milling system combines the preparation of TEM, SEM and LM samples in one single benchtop unit, Contact:Tobias Krekeler, Tel.: -4667.
Ultramicrotome Leica EM UC7, additional information at Leica Microsystems (Building M, Room 2556, Contact: Lida Wang, Tel.: -4574)
Leica EM TXP (Building M, Room 2556, Contact: Lida Wang, Tel.: -4574)
Sputter Coater SCD 050 by Baltec (Building M, Room 3526, Contact: Tobias Krekeler, Tel.: -4667)
Critical Point Dryer CPD 7501 by Polaron (Building M, Room 2549, Contact: Jens Timmermann, Tel.: -4575)