Sample preparation

  • Leica EM RES102 The unique ion beam milling system combines the preparation of TEM, SEM and LM samples in one single benchtop unit, Contact:Tobias Krekeler, Tel.: -4667.
  • Leica EM TXP
    (Building M, Room 2556, Contact: Lida Wang, Tel.: -4574)
  • Sputter Coater SCD 050 by Baltec
    (Building M, Room 3526, Contact: Tobias Krekeler, Tel.: -4667)
  • Struers TenuPol-3
    (Building M, Room 2549, Contact: Lida Wang, Tel.: -4574)