Publications from 2000:

1	Exchange-Stiffness Constant in Cold-Worked and Nanocrystalline Ni Measured by Elastic Small-Angle Neutron Scattering A. Michels, J. Weissmüller, A. Wiedenmann, and J. Barker Journal of Applied Physics 87 (2000), 5953 - 5955.
2	On the Size-Dependence of the Critical Point of Nanoscale Interstitial Solid Solutions J. Weissmüller and C. Lemier Philosophical Magazine Letters 80 (2000), 411-418.
3	Measuring the Exchange-Stiffness Constant of Nanocrystalline Solids by Elastic Small-Angle Neutron Scattering A. Michels, J. Weissmüller, A. Wiedenmann, J.S. Pedersen, and J.G. Barker Philosophical Magazine Letters 80 (2000), 785-792.
4	Neuartige Nb- und Ti-verstärkte Al₂O₃-Verbundwerkstoffe: Herstellung, Eigenschaften und potentielle Anwendungen R. Günther, T. Klassen, A. Bartels, R. Bormann DKG Handbuch Technische Keramische Werkstoffe (2000), Kriegesmann, J., Kapitel 4.1.1.1, pp. 1-19
5	Preparation and Properties of novel Nb- and Ti-based metal reinforced Alumina Composites with interpenetrating Microstructure R. Günther, T. Klassen, B. Dickau, F. Gärtner, A. Bartels, R. Bormann EUROMAT 99 (2000), München, Wiley-VCH
6	Advanced Nanocrystalline Materials and Potential Applications T. Klassen, R. Bohn, G. Fanta, W. Oelerich, R. Günther, N. Eigen, E. Aust, R. Bormann, F. Gärtner, H. Kreye International Symposium on Amorphous an Nanocrystalline Materials (2000), Sendai/Japan, pp. 36-43
7	Potential Applications of Nanocrystalline Materials T. Klassen, W. Oelerich, F. Gärtner, R. Günther, R. Bormann Proc. Materials Week 2000, München (D)
8	Advanced Nanocrystalline Materials and Potential Applications T. Klassen, G. Fanta, W. Oelerich, R. Günther, N. Eigen, E. Aust, R. Bormann, F. Gärtner, H. Kreye Materials Week 2000
9	Correlation of Point Defeats, Ordering and Ultra-Microhardness of B2/DO3 ordered Ironaluminides J. Laakmann, C. Hartig, H. Mecking Euromat (2000), Wiley-VCH Verlag, 10, pp. 300
10	Resonant x-ray scattering from the surface of a dilute liquid Hq-Au alloy DiMasi, E., Tostmann, H., Ocko, B.M., Huber, P., O.G., Shpyrko, Pershan, P.S., Deutsch, M. and Berman, L. MRS Proccedings(2000), 590.