• Hauptnavigation
  • Unternavigation
  • Inhalt
  • Suche
TUHH

Institute Advanced Ceramics
Institute Advanced Ceramics

Menu
show search form
  • en
  • de
  • Research
  • Publications
  • Outreach
  • Vacancies
TUHH > GK > Research > AFM - Nanoindentation

Atomic Force Mircroscopy / Nanoindentation

 

 

Characterization of Ferroelectric Materials with Scanning Probe Microscopy
  • Effect of charges and polarization around cracks on the fracture toughness of ferroelectric materials analyzed by Kelvin-Force-Microscopy and 4 Point bending tests

  • Characterization of lead-free ferroelectrics with Piezoresponse Force Microscopy

  • Tip-sample interaction in force modulation microscopy: mechanical properties at nanoscale level

  • BISNANO:  Lead-free ferroelectric thin films analyzed with PFM within the BisNano project

 

 

Contact person:


Dipl.-Ing. Andrea Engert

 

Contact person:

M. Sc. Rodrigo Pacher Fernandes

 

 

(project completed)

 

 

Mechanical Characterization of Biomineralized Materials
  • Investigation of enamel’s mechanical behaviors at different length scales
Contact person:

M. Sc. Siang Fung Ang

Dipl.-Ing. Sabine Bechtle

Nanoindentation on ceramics
  • Nanoindentation on ferroelectric and structural ceramics
(project completed)

  • Fracture Mechanics
  • AFM - Nanoindentation
    • Charge and Polarization around Cracks of Ferroelectrics Materials
    • Leadfree Piezoceramics for Actors
    • Mechanical Properties at Nanoscale Level
    • BisNano project
    • Investigation of Enamel
    • Nanoindention on Ceramics
  • Processing
  • Computational Materials Modelling and Design (CoMMoD)
  • Integrated Materials Systems Group

Manfred Geerken, 2022/02/16
 Contacts
Imprint | Data Privacy

Technische Universität Hamburg
Institute Advanced Ceramics
Denickestraße 15, 21073 Hamburg, Germany

Phone +49 40 42878-3237 | Fax +49 40 42731-3622 | Email Manfred Geerken