[76916] |
Title: Analyzing superparamagnetic iron oxide nanoparticles (spions) using electrical impedance spectroscopy. <em>2015 5th</em> |
Written by: T. Welzel, C. Debbeler, M. Graeser, S. Kaufmann, R. Kusche, and K. Lüdtke-\-Buzug |
in: <em>International Workshop on {Magnetic Particle Imaging} ({IWMPI}), IEEE Xplore Digital Library</em>. (2015). |
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DOI: 10.1109/IWMPI.2015.7107062 |
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Note: inproceedings
Abstract: Conventional methods to evaluate the size of superparamagnetic iron oxide nanoparticles ({SPIONs}) and their coatings used in magnetic particle imaging ({MPI}) include photon cross-correlation spectroscopy ({PCCS}) [1], atomic force microscopy ({AFM}) [1] and transmission electron microscopy ({TEM}) [2]. There is however still a potential for improvement as they are expensive and only able to analyze small sample quantities. In this work, a new method using electrical impedance spectroscopy is evaluated. With this method, it is possible to analyze macroscopic samples at low costs.
[76916] |
Title: Analyzing superparamagnetic iron oxide nanoparticles (spions) using electrical impedance spectroscopy. <em>2015 5th</em> |
Written by: T. Welzel, C. Debbeler, M. Graeser, S. Kaufmann, R. Kusche, and K. Lüdtke-\-Buzug |
in: <em>International Workshop on {Magnetic Particle Imaging} ({IWMPI}), IEEE Xplore Digital Library</em>. (2015). |
Volume: Number: |
on pages: |
Chapter: |
Editor: |
Publisher: |
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Address: |
Edition: |
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how published: |
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Institution: |
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DOI: 10.1109/IWMPI.2015.7107062 |
URL: |
ARXIVID: |
PMID: |
Note: inproceedings
Abstract: Conventional methods to evaluate the size of superparamagnetic iron oxide nanoparticles ({SPIONs}) and their coatings used in magnetic particle imaging ({MPI}) include photon cross-correlation spectroscopy ({PCCS}) [1], atomic force microscopy ({AFM}) [1] and transmission electron microscopy ({TEM}) [2]. There is however still a potential for improvement as they are expensive and only able to analyze small sample quantities. In this work, a new method using electrical impedance spectroscopy is evaluated. With this method, it is possible to analyze macroscopic samples at low costs.
[76916] |
Title: Analyzing superparamagnetic iron oxide nanoparticles (spions) using electrical impedance spectroscopy. <em>2015 5th</em> |
Written by: T. Welzel, C. Debbeler, M. Graeser, S. Kaufmann, R. Kusche, and K. Lüdtke-\-Buzug |
in: <em>International Workshop on {Magnetic Particle Imaging} ({IWMPI}), IEEE Xplore Digital Library</em>. (2015). |
Volume: Number: |
on pages: |
Chapter: |
Editor: |
Publisher: |
Series: |
Address: |
Edition: |
ISBN: |
how published: |
Organization: |
School: |
Institution: |
Type: |
DOI: 10.1109/IWMPI.2015.7107062 |
URL: |
ARXIVID: |
PMID: |
Note: inproceedings
Abstract: Conventional methods to evaluate the size of superparamagnetic iron oxide nanoparticles ({SPIONs}) and their coatings used in magnetic particle imaging ({MPI}) include photon cross-correlation spectroscopy ({PCCS}) [1], atomic force microscopy ({AFM}) [1] and transmission electron microscopy ({TEM}) [2]. There is however still a potential for improvement as they are expensive and only able to analyze small sample quantities. In this work, a new method using electrical impedance spectroscopy is evaluated. With this method, it is possible to analyze macroscopic samples at low costs.
[76916] |
Title: Analyzing superparamagnetic iron oxide nanoparticles (spions) using electrical impedance spectroscopy. <em>2015 5th</em> |
Written by: T. Welzel, C. Debbeler, M. Graeser, S. Kaufmann, R. Kusche, and K. Lüdtke-\-Buzug |
in: <em>International Workshop on {Magnetic Particle Imaging} ({IWMPI}), IEEE Xplore Digital Library</em>. (2015). |
Volume: Number: |
on pages: |
Chapter: |
Editor: |
Publisher: |
Series: |
Address: |
Edition: |
ISBN: |
how published: |
Organization: |
School: |
Institution: |
Type: |
DOI: 10.1109/IWMPI.2015.7107062 |
URL: |
ARXIVID: |
PMID: |
Note: inproceedings
Abstract: Conventional methods to evaluate the size of superparamagnetic iron oxide nanoparticles ({SPIONs}) and their coatings used in magnetic particle imaging ({MPI}) include photon cross-correlation spectroscopy ({PCCS}) [1], atomic force microscopy ({AFM}) [1] and transmission electron microscopy ({TEM}) [2]. There is however still a potential for improvement as they are expensive and only able to analyze small sample quantities. In this work, a new method using electrical impedance spectroscopy is evaluated. With this method, it is possible to analyze macroscopic samples at low costs.
[76916] |
Title: Analyzing superparamagnetic iron oxide nanoparticles (spions) using electrical impedance spectroscopy. <em>2015 5th</em> |
Written by: T. Welzel, C. Debbeler, M. Graeser, S. Kaufmann, R. Kusche, and K. Lüdtke-\-Buzug |
in: <em>International Workshop on {Magnetic Particle Imaging} ({IWMPI}), IEEE Xplore Digital Library</em>. (2015). |
Volume: Number: |
on pages: |
Chapter: |
Editor: |
Publisher: |
Series: |
Address: |
Edition: |
ISBN: |
how published: |
Organization: |
School: |
Institution: |
Type: |
DOI: 10.1109/IWMPI.2015.7107062 |
URL: |
ARXIVID: |
PMID: |
Note: inproceedings
Abstract: Conventional methods to evaluate the size of superparamagnetic iron oxide nanoparticles ({SPIONs}) and their coatings used in magnetic particle imaging ({MPI}) include photon cross-correlation spectroscopy ({PCCS}) [1], atomic force microscopy ({AFM}) [1] and transmission electron microscopy ({TEM}) [2]. There is however still a potential for improvement as they are expensive and only able to analyze small sample quantities. In this work, a new method using electrical impedance spectroscopy is evaluated. With this method, it is possible to analyze macroscopic samples at low costs.
[76916] |
Title: Analyzing superparamagnetic iron oxide nanoparticles (spions) using electrical impedance spectroscopy. <em>2015 5th</em> |
Written by: T. Welzel, C. Debbeler, M. Graeser, S. Kaufmann, R. Kusche, and K. Lüdtke-\-Buzug |
in: <em>International Workshop on {Magnetic Particle Imaging} ({IWMPI}), IEEE Xplore Digital Library</em>. (2015). |
Volume: Number: |
on pages: |
Chapter: |
Editor: |
Publisher: |
Series: |
Address: |
Edition: |
ISBN: |
how published: |
Organization: |
School: |
Institution: |
Type: |
DOI: 10.1109/IWMPI.2015.7107062 |
URL: |
ARXIVID: |
PMID: |
Note: inproceedings
Abstract: Conventional methods to evaluate the size of superparamagnetic iron oxide nanoparticles ({SPIONs}) and their coatings used in magnetic particle imaging ({MPI}) include photon cross-correlation spectroscopy ({PCCS}) [1], atomic force microscopy ({AFM}) [1] and transmission electron microscopy ({TEM}) [2]. There is however still a potential for improvement as they are expensive and only able to analyze small sample quantities. In this work, a new method using electrical impedance spectroscopy is evaluated. With this method, it is possible to analyze macroscopic samples at low costs.