| [76916] |
| Title: Analyzing superparamagnetic iron oxide nanoparticles (spions) using electrical impedance spectroscopy. <em>2015 5th</em> |
| Written by: T. Welzel, C. Debbeler, M. Graeser, S. Kaufmann, R. Kusche, and K. Lüdtke-\-Buzug |
| in: <em>International Workshop on {Magnetic Particle Imaging} ({IWMPI}), IEEE Xplore Digital Library</em>. (2015). |
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| DOI: 10.1109/IWMPI.2015.7107062 |
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Note: inproceedings
Abstract: Conventional methods to evaluate the size of superparamagnetic iron oxide nanoparticles ({SPIONs}) and their coatings used in magnetic particle imaging ({MPI}) include photon cross-correlation spectroscopy ({PCCS}) [1], atomic force microscopy ({AFM}) [1] and transmission electron microscopy ({TEM}) [2]. There is however still a potential for improvement as they are expensive and only able to analyze small sample quantities. In this work, a new method using electrical impedance spectroscopy is evaluated. With this method, it is possible to analyze macroscopic samples at low costs.
| [76916] |
| Title: Analyzing superparamagnetic iron oxide nanoparticles (spions) using electrical impedance spectroscopy. <em>2015 5th</em> |
| Written by: T. Welzel, C. Debbeler, M. Graeser, S. Kaufmann, R. Kusche, and K. Lüdtke-\-Buzug |
| in: <em>International Workshop on {Magnetic Particle Imaging} ({IWMPI}), IEEE Xplore Digital Library</em>. (2015). |
| Volume: Number: |
| on pages: |
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| DOI: 10.1109/IWMPI.2015.7107062 |
| URL: |
| ARXIVID: |
| PMID: |
Note: inproceedings
Abstract: Conventional methods to evaluate the size of superparamagnetic iron oxide nanoparticles ({SPIONs}) and their coatings used in magnetic particle imaging ({MPI}) include photon cross-correlation spectroscopy ({PCCS}) [1], atomic force microscopy ({AFM}) [1] and transmission electron microscopy ({TEM}) [2]. There is however still a potential for improvement as they are expensive and only able to analyze small sample quantities. In this work, a new method using electrical impedance spectroscopy is evaluated. With this method, it is possible to analyze macroscopic samples at low costs.
| [76916] |
| Title: Analyzing superparamagnetic iron oxide nanoparticles (spions) using electrical impedance spectroscopy. <em>2015 5th</em> |
| Written by: T. Welzel, C. Debbeler, M. Graeser, S. Kaufmann, R. Kusche, and K. Lüdtke-\-Buzug |
| in: <em>International Workshop on {Magnetic Particle Imaging} ({IWMPI}), IEEE Xplore Digital Library</em>. (2015). |
| Volume: Number: |
| on pages: |
| Chapter: |
| Editor: |
| Publisher: |
| Series: |
| Address: |
| Edition: |
| ISBN: |
| how published: |
| Organization: |
| School: |
| Institution: |
| Type: |
| DOI: 10.1109/IWMPI.2015.7107062 |
| URL: |
| ARXIVID: |
| PMID: |
Note: inproceedings
Abstract: Conventional methods to evaluate the size of superparamagnetic iron oxide nanoparticles ({SPIONs}) and their coatings used in magnetic particle imaging ({MPI}) include photon cross-correlation spectroscopy ({PCCS}) [1], atomic force microscopy ({AFM}) [1] and transmission electron microscopy ({TEM}) [2]. There is however still a potential for improvement as they are expensive and only able to analyze small sample quantities. In this work, a new method using electrical impedance spectroscopy is evaluated. With this method, it is possible to analyze macroscopic samples at low costs.
| [76916] |
| Title: Analyzing superparamagnetic iron oxide nanoparticles (spions) using electrical impedance spectroscopy. <em>2015 5th</em> |
| Written by: T. Welzel, C. Debbeler, M. Graeser, S. Kaufmann, R. Kusche, and K. Lüdtke-\-Buzug |
| in: <em>International Workshop on {Magnetic Particle Imaging} ({IWMPI}), IEEE Xplore Digital Library</em>. (2015). |
| Volume: Number: |
| on pages: |
| Chapter: |
| Editor: |
| Publisher: |
| Series: |
| Address: |
| Edition: |
| ISBN: |
| how published: |
| Organization: |
| School: |
| Institution: |
| Type: |
| DOI: 10.1109/IWMPI.2015.7107062 |
| URL: |
| ARXIVID: |
| PMID: |
Note: inproceedings
Abstract: Conventional methods to evaluate the size of superparamagnetic iron oxide nanoparticles ({SPIONs}) and their coatings used in magnetic particle imaging ({MPI}) include photon cross-correlation spectroscopy ({PCCS}) [1], atomic force microscopy ({AFM}) [1] and transmission electron microscopy ({TEM}) [2]. There is however still a potential for improvement as they are expensive and only able to analyze small sample quantities. In this work, a new method using electrical impedance spectroscopy is evaluated. With this method, it is possible to analyze macroscopic samples at low costs.
| [76916] |
| Title: Analyzing superparamagnetic iron oxide nanoparticles (spions) using electrical impedance spectroscopy. <em>2015 5th</em> |
| Written by: T. Welzel, C. Debbeler, M. Graeser, S. Kaufmann, R. Kusche, and K. Lüdtke-\-Buzug |
| in: <em>International Workshop on {Magnetic Particle Imaging} ({IWMPI}), IEEE Xplore Digital Library</em>. (2015). |
| Volume: Number: |
| on pages: |
| Chapter: |
| Editor: |
| Publisher: |
| Series: |
| Address: |
| Edition: |
| ISBN: |
| how published: |
| Organization: |
| School: |
| Institution: |
| Type: |
| DOI: 10.1109/IWMPI.2015.7107062 |
| URL: |
| ARXIVID: |
| PMID: |
Note: inproceedings
Abstract: Conventional methods to evaluate the size of superparamagnetic iron oxide nanoparticles ({SPIONs}) and their coatings used in magnetic particle imaging ({MPI}) include photon cross-correlation spectroscopy ({PCCS}) [1], atomic force microscopy ({AFM}) [1] and transmission electron microscopy ({TEM}) [2]. There is however still a potential for improvement as they are expensive and only able to analyze small sample quantities. In this work, a new method using electrical impedance spectroscopy is evaluated. With this method, it is possible to analyze macroscopic samples at low costs.
| [76916] |
| Title: Analyzing superparamagnetic iron oxide nanoparticles (spions) using electrical impedance spectroscopy. <em>2015 5th</em> |
| Written by: T. Welzel, C. Debbeler, M. Graeser, S. Kaufmann, R. Kusche, and K. Lüdtke-\-Buzug |
| in: <em>International Workshop on {Magnetic Particle Imaging} ({IWMPI}), IEEE Xplore Digital Library</em>. (2015). |
| Volume: Number: |
| on pages: |
| Chapter: |
| Editor: |
| Publisher: |
| Series: |
| Address: |
| Edition: |
| ISBN: |
| how published: |
| Organization: |
| School: |
| Institution: |
| Type: |
| DOI: 10.1109/IWMPI.2015.7107062 |
| URL: |
| ARXIVID: |
| PMID: |
Note: inproceedings
Abstract: Conventional methods to evaluate the size of superparamagnetic iron oxide nanoparticles ({SPIONs}) and their coatings used in magnetic particle imaging ({MPI}) include photon cross-correlation spectroscopy ({PCCS}) [1], atomic force microscopy ({AFM}) [1] and transmission electron microscopy ({TEM}) [2]. There is however still a potential for improvement as they are expensive and only able to analyze small sample quantities. In this work, a new method using electrical impedance spectroscopy is evaluated. With this method, it is possible to analyze macroscopic samples at low costs.