Spatially Resolved Loss Measurement in Silicon Waveguides using Optical Frequency-Domain Reflectometry

Spatially Resolved Loss Measurement in Silicon Wav

Jost Müller, M. Krause, E. Brinkmeyer,
Spatially Resolved Loss Measurement in Silicon Waveguides using Optical Frequency-Domain Reflectometry
Electron. Lett. 47(11), pp. 668-670 (2011)

Abstract: distributed reflectivity, localized return loss, capture fraction, and properties of waveguide

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