Characterizing silicon waveguides: local attenuation and distributed reflectivity

Characterizing silicon waveguides: local attenuation an

Jost Müller, E. Brinkmeyer,
Characterizing silicon waveguides: local attenuation and distributed reflectivity
European Conference on Optical Communication (ECOC), September 18-22, Geneva, Suisse (We.10.P1.41), (2011)

Abstract: Characterizing silicon nanophotonic waveguides with regard to local loss and distributed reflectivity, localized return loss, capture fraction, and properties of waveguide tapers is shown to be feasible. Our OFDR-based technique is reliable, fast and nondestructive.

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