Journal Publications
| [120343] |
| Title: Magnetic field based system matrix corrections for multi-patch MPI reconstructions. |
| Written by: M. Boberg, M. Möddel, and T. Knopp |
| in: <em>9th International Congress on Industrial and Applied Mathematics (ICIAM 2019)</em>. (2019). |
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| on pages: 333 |
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| URL: https://iciam2019.org/images/site/news/ICIAM2019_PROGRAM_ABSTRACTS_BOOK.pdf#page=333 |
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Note: inproceedings, multi-patch, artifact
Abstract: Magnetic particle imaging is an imaging modality, which determines the spatial distribution of super-paramagnetic nanoparticles by solving a linear system of equations. Using multi-patch approaches the field-of-view in MPI can be enlarged. Due to field imperfections a dedicated system matrix for each patch is required to reduce artifacts in the reconstructed image. However, this results in long calibration times. In this talk, techniques are presented to reduce the calibration time while maintaining high quality.
| [120343] |
| Title: Magnetic field based system matrix corrections for multi-patch MPI reconstructions. |
| Written by: M. Boberg, M. Möddel, and T. Knopp |
| in: <em>9th International Congress on Industrial and Applied Mathematics (ICIAM 2019)</em>. (2019). |
| Volume: Number: |
| on pages: 333 |
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| Editor: |
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| URL: https://iciam2019.org/images/site/news/ICIAM2019_PROGRAM_ABSTRACTS_BOOK.pdf#page=333 |
| ARXIVID: |
| PMID: |
Note: inproceedings, multi-patch, artifact
Abstract: Magnetic particle imaging is an imaging modality, which determines the spatial distribution of super-paramagnetic nanoparticles by solving a linear system of equations. Using multi-patch approaches the field-of-view in MPI can be enlarged. Due to field imperfections a dedicated system matrix for each patch is required to reduce artifacts in the reconstructed image. However, this results in long calibration times. In this talk, techniques are presented to reduce the calibration time while maintaining high quality.
Conference Proceedings
| [120343] |
| Title: Magnetic field based system matrix corrections for multi-patch MPI reconstructions. |
| Written by: M. Boberg, M. Möddel, and T. Knopp |
| in: <em>9th International Congress on Industrial and Applied Mathematics (ICIAM 2019)</em>. (2019). |
| Volume: Number: |
| on pages: 333 |
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| Editor: |
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| URL: https://iciam2019.org/images/site/news/ICIAM2019_PROGRAM_ABSTRACTS_BOOK.pdf#page=333 |
| ARXIVID: |
| PMID: |
Note: inproceedings, multi-patch, artifact
Abstract: Magnetic particle imaging is an imaging modality, which determines the spatial distribution of super-paramagnetic nanoparticles by solving a linear system of equations. Using multi-patch approaches the field-of-view in MPI can be enlarged. Due to field imperfections a dedicated system matrix for each patch is required to reduce artifacts in the reconstructed image. However, this results in long calibration times. In this talk, techniques are presented to reduce the calibration time while maintaining high quality.
| [120343] |
| Title: Magnetic field based system matrix corrections for multi-patch MPI reconstructions. |
| Written by: M. Boberg, M. Möddel, and T. Knopp |
| in: <em>9th International Congress on Industrial and Applied Mathematics (ICIAM 2019)</em>. (2019). |
| Volume: Number: |
| on pages: 333 |
| Chapter: |
| Editor: |
| Publisher: |
| Series: |
| Address: |
| Edition: |
| ISBN: |
| how published: |
| Organization: |
| School: |
| Institution: |
| Type: |
| DOI: |
| URL: https://iciam2019.org/images/site/news/ICIAM2019_PROGRAM_ABSTRACTS_BOOK.pdf#page=333 |
| ARXIVID: |
| PMID: |
Note: inproceedings, multi-patch, artifact
Abstract: Magnetic particle imaging is an imaging modality, which determines the spatial distribution of super-paramagnetic nanoparticles by solving a linear system of equations. Using multi-patch approaches the field-of-view in MPI can be enlarged. Due to field imperfections a dedicated system matrix for each patch is required to reduce artifacts in the reconstructed image. However, this results in long calibration times. In this talk, techniques are presented to reduce the calibration time while maintaining high quality.
