@inproceedings{SFD+:2005,
author = {Junhao Shi and Goerschwin Fey and Rolf Drechsler and Andreas Glowatz and Juergen Schloeffel and Friedrich Hapke},
title = {PASSAT: Efficient SAT-based Test Pattern Generation.},
year = {2005},
pages = {212-217},
note = {gfey, CE},
howpublished = {05-999 SFD+:2005 ISVLSI},
booktitle = {IEEE Annual Symposium on VLSI (ISVLSI)}
}

@COMMENT{Bibtex file generated on 2026-5-22 with typo3 si_bibtex plugin. Data from https://www.tuhh.de/es/home/publications }