@inproceedings{SFD+:2005b,
author = {Junhao Shi and Goerschwin Fey and Rolf Drechsler and Andreas Glowatz and Juergen Schloeffel and Friedrich Hapke},
title = {Experimental Studies on SAT-based Test Pattern Generation for Industrial Circuits.},
year = {2005},
note = {gfey, CE},
howpublished = {05-999 SFD+:2005b ASICON},
booktitle = {IEEE Int'l Conference on ASIC (ASICON)}
}

@COMMENT{Bibtex file generated on 2026-5-22 with typo3 si_bibtex plugin. Data from https://www.tuhh.de/es/home/publications }