@inproceedings{SFD:2003b,
author = {Junhao Shi and Goerschwin Fey and Rolf Drechsler},
title = {Random Pattern Testability of Circuits Derived from BDDs.},
year = {2003},
pages = {70-78},
note = {gfey, CE},
howpublished = {03-999 SFD:2003b WRTLT},
booktitle = {IEEE Workshop on RTL and High Level Testing (WRTLT)}
}

@COMMENT{Bibtex file generated on 2026-6-28 with typo3 si_bibtex plugin. Data from https://www.tuhh.de/es/de/home/publications }