@inproceedings{FSD:2003,
author = {Goerschwin Fey and Junhao Shi and Rolf Drechsler},
title = {BDD Circuit Optimization for Path Delay Fault-Testability.},
year = {2003},
note = {gfey, CE},
howpublished = {03-999 FSD:2003 TUZ},
booktitle = {GI/GMM/ITG-Workshop für Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TUZ)}
}

@COMMENT{Bibtex file generated on 2026-6-29 with typo3 si_bibtex plugin. Data from https://www.tuhh.de/es/de/home/publications }