@inproceedings{FMF+:2017,
author = {Tino Flenker and Jan Malburg and Görschwin Fey and Serhiy Avramenko and Massimo Violante and Matteo Sonza Reorda},
title = {Towards Making Fault Injection on Abstract Models a More Accurate Tool for Predicting RT-Level Effects.},
year = {2017},
note = {gfey, CE},
howpublished = {17-999 FMF+:2017 ISVLSI},
booktitle = {IEEE Annual Symposium on VLSI (ISVLSI)}
}

@COMMENT{Bibtex file generated on 2026-6-30 with typo3 si_bibtex plugin. Data from https://www.tuhh.de/es/de/home/publications }