@inproceedings{FSD:2004,
author = {Goerschwin Fey and Junhao Shi and Rolf Drechsler},
title = {BDD Circuit Optimization for Path Delay Fault Testability.},
year = {2004},
pages = {162-172},
note = {gfey, CE},
howpublished = {04-999 FSD:2004 DSD_EUROMICRO},
booktitle = {EUROMICRO Symposium on Digital System Design (DSD)}
}

@COMMENT{Bibtex file generated on 2026-6-28 with typo3 si_bibtex plugin. Data from https://www.tuhh.de/es/de/home/publications }