@inproceedings{BF:2019c,
author = {Fin Hendrik Bahnsen and Goerschwin Fey},
title = {Neural Networks for Monitoring Embedded Devices.},
year = {2019},
note = {gfey, fbahnsen, CE},
howpublished = {19-999 BF:2019c TUZ},
booktitle = {GI/GMM/ITG-Workshop für Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TUZ)}
}

@COMMENT{Bibtex file generated on 2026-6-30 with typo3 si_bibtex plugin. Data from https://www.tuhh.de/es/de/home/publications }